Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS

Date and Time: 
Thursday, August 17, 2017 - 9:00am-Friday, August 18, 2017 - 4:00pm
Location: 
Marcus Nanotechnology Building, 345 Ferst Drive, Atlanta GA 30332

Announcing a New Short Course: Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS

 

A detailed introduction to the principles and practice of two techniques for analyzing the first few monolayers of a surface: XPS -the most common surface analytical method and ToF-SIMS a mass-spectroscopy-based method complementary in many ways to XPS.  Taken together they allow:

·         The detection of the elemental composition of a sample

·         The detection of even trace elements down to ppm of a monolayer

·         The chemical bonding between elements

·         The lateral and vertical distribution of elements in the top layers of a sample

·         The surface bonding and band structure of compounds including work function and band occupancy

Target Audience:

Attendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users. The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces including catalysts; thin-film metals and semiconductors; low-dimensional materials such as graphene, CNT's, and MoS2; polymers for food packaging or medical implants; corrosion studies in metals; among other materials. The course should prove useful to everyone from the interested novice, unfamiliar with these techniques - but with a practical need for information about the surface composition/chemistry of a sample - up to those with even a moderately advanced practical XPS or SIMS background looking to develop a deeper understanding.

 

Preliminary Agenda
Day1 – Photoelectron Spectroscopy:
  9:00am -  Introduction and Scope of Short Course – Prof. F. Alamgir
  9:15am  - 10:00: Lecture pt. I:  Theoretical background of Photoelectron Spectroscopy
10:05am  - 10:30: Tour of MCF characterization labs
10:35am  -  10:45: Coffee break
10:50am  - 11:35: Lecture pt. II:  Theoretical background of Photoelectron Spectroscopy
12:00pm  - 1:00: Lunch break
  1:05pm  -  1:45: Introduction to XPS analysis software
  1:45pm  - 3:05: XPS hands-on operation and data analysis sessions. 
  3:10 - 4:00pm: General comments:  Open question and answer session

Day2 – Time of Flight SIMS:
  9:30am - Introduction – Professor Faisal Alamgir
  9:35 - 10:15am: Lecture pt. I:  Theoretical background of SIMS/ ToF-SIMS
10:15 - 10:30am: Tour of IEN microfabrication facility
10:35 - 10:45am: Coffee break
10:50 - 11:30am: Practical concerns for ToF-SIMS and Alternate Surface Science Techniques
11:30 - 1:00am: Lunch break
  1:05 - 1:15am: Introduction to ToF-SIMS analysis software
  1:15 - 3:15am: ToF-SIMS for hands-on analysis session.
  3:20 - 3:55am: Open question and answer session

 

                 Register Here