Georgia Tech Characterization Short Course Series: Surface Science Techniques – Focus on Photoelectron Spectroscopy and ToF-SIMS

Date and Time: 
Thursday, December 13, 2018 - 8:30am-Friday, December 14, 2018 - 4:00pm
Marcus Nanotechnology Building | 345 Ferst Dr NW | Atlanta, GA 30332

Attendance is open to the general technical community and is not limited to current Georgia Tech students or IEN users. The course will be of value to anyone needing to analyze the physical-chemical properties of surfaces including catalysts; thin-film metals and semiconductors; low-dimensional materials such as graphene, CNT's, and MoS2; polymers for food packaging or medical implants; corrosion studies in metals; among other materials. The course should prove useful to everyone from the interested novice, unfamiliar with these techniques - but with a practical need for information about the surface composition/chemistry of a sample - up to those with even a moderately advanced practical XPS or SIMS background looking to develop a deeper understanding.

Rates: *Rates include lunches on all days*

Georgia Tech Rate: $150
Academic and Government Rate: $250
Industry Rate: $500


Day1 – Photoelectron Spectroscopy:

08:30 – Registration starts

09:00:  Introduction and Scope of Short Course – Prof. F. Alamgir

Morning session including the following activities:

  • Lecture onTheoretical background of Photoelectron Spectroscopy
  • Tour of MCF characterization labs
  • Coffee break

12:00 – 13:00:  Lunch break

Afternoon session include the following activities: 

  • Introduction to XPS analysis software
  • XPS hands-on operation and data analysis sessions.

15:10 – 16:00:  General comments:  Open question and answer session

Day2 – Time of Flight SIMS:

09:00 – Breakfast starts

09:30:  Introduction– Prof. F. Alamgir

Morning session including the following activities:

  • Tour of IEN microfabrication facility
  • Coffee break
  • Practical concerns for ToF-SIMS and Alternate Surface Science Techniques

11:30 – 13:00:  Lunch break

Afternoon session including the following activities: 

  • Remote Demonstration of ToF-SIMS operation
  • ToF-SIMS Data analysis and/or hands-on session.
  • Open question and answer session

16:00: Closing comments